Bead probes are used to contact small solder beads directly on PCB tracks or micro-vias (bead probe technology).  To ensure optimal contact with the various bead geometries, configurations, and surfaces, the largest selection of tip styles on the market is available from INGUN. INGUN bead probe test probes are 100% compatible with the standard GKS-050/075/100/135 series.

The tip-style 02 – flat - is preferably used for flux-free and/or small beads.

The tip-style 60 – fine-serrated – is recommended (due to the fine, aggressive points) for breaking open the surfaces of the beads, which are coated
with flux-deposits.

The multi-blade tip style 79 (star) is recommended for long, narrow, or large beads with solder flux deposits thanks to the self-cleaning horizontal
cutting edge.

Flying test probes are used in flying probe systems. Maximum precision and contacting accuracy is achieved by the geometry of the barrel, as well as the specialised beading, which enables contacting in 0.15 mm grids.
INGUN recommends the GKS-112 MD series for use in the flying probe system from Scorpion/Acculogic and Digitaltest.